X-Ray Diffractometer (XRD), KPR Institute Engineering and Technology, Autonomous Engineering Institution, Coimbatore, India

Instrument Mesurements

• High temperature XRD (up to 1600oC)
• Grazing Incidence XRD (GIXRD)
• Small Angle X-Ray Scattering (SAXS)
• X-Ray Reflectivity (XRR)
• Low Angle XRD
• Phase Identification/Quantification
• Structure Refinement
• Microstructure
• Indexing
• Fiber Orientation

Softwares available

• Bruker EVA 6.0
• TOPAS 6.0
• ICDD PDF Axiom 2021

Software capabilities

• Indexing
• Structural Refinement
• Quantitative Phase Analysis
• Degree of Crystallinity
• Microstructure
• Crystallite size calculation

Technical Details

• Max. usable angular range = 2Theta ≤ 168°
• Smallest addressable increment = 0.005°
• Max. angular speed = 20°/s
• MTC High temperature chamber RT to 1600oC
• Cu anode with 3kW Generator
• Twin-Twin Optics (Motorized slit and Göbel Mirror)
• LYNXEYE Family Detector (0D and 1D mode)